Semiconductor Engineering

Challenges And Outlook Of ATE Testing For 2nm SoCs

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...
Digi Times

Chroma ATE develops comprehensive semiconductor testing Solutions, strategically positioning for 2025 global market

Semiconductor testing plays a crucial role in the supply chain, with industry players prioritizing factors such as test speed, cost, signal measurement accuracy, one-stop test capabilities, and ...
Semiconductor Engineering

A Customized Low-Cost Approach For S-Parameter Validation Of ATE Test Fixtures

This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...
EDN

Can ATE vendors lower chip-testing costs?

SAN JOSE — During the Semicon West trade show here this week, suppliers of automatic test equipment (ATE) are expected to announce or show a new class of products that finally promises to lower the ...
Electronic Design

Using ATE for Efficient DigRF Interface Testing

Although the term DigRF may lead to initial impressions of a digital signal somehow integrated into an RF signal path, this is not the case. DigRF is a published standard that describes a digital ...